The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2003

Filed:

Nov. 30, 1999
Applicant:
Inventors:

Chin-Long Chen, Fishkill, NY (US);

Mu-Yue Hsiao, Poughkeepsie, NY (US);

Patrick J. Meaney, Poughkeepsie, NY (US);

William Wu Shen, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 2/900 ; H03M 1/300 ;
U.S. Cl.
CPC ...
G11C 2/900 ; H03M 1/300 ;
Abstract

Uncorrectable errors are isolated to one component of a computing system comprising a plurality of components. First, upon detection of an uncorrectable error, a special check bit pattern is generated. This check bit pattern is used to indicate the occurrence of an uncorrectable error, as well as the location of the occurrence of the error. Subsequently, the check bit pattern is incorporated into the data word being transmitted, and thus may be used to isolate an uncorrectable error to the exact location of occurrence.


Find Patent Forward Citations

Chen, Chin-Long. (2003). Generating special uncorrectable error codes for failure isolation (U.S. Patent No. 6519736). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6519736

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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