The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2003
Filed:
Jun. 01, 1999
Ronald F. Forman, Bryon, MN (US);
Steven G. Halverson, Rochester, MN (US);
David F. Legler, Rochester, MN (US);
William A. Lynch, Rochester, MN (US);
Larry N. Robel, Rochester, MN (US);
Michael A. Schlasner, Rochester, MN (US);
Walter H. Schwane, Mantorville, MN (US);
Patrick M. Wildt, Rochester, MN (US);
Keith A. Zblewski, Kasson, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The preferred embodiment of the present invention provides system for data collection that provides a solution that can be easily extended to collect different data types. The preferred embodiment provides a collection repository that stores different collected data types with a single consistent interface for accessing the collected data. The preferred embodiment is a data collector implemented from an object-oriented framework. The object-oriented data collector can be easily extended by adding additional instances of the data collector from the framework. The preferred embodiment framework includes mechanisms for global customization of the collector and synchronization of the collection. The preferred embodiment also includes base probe classes that define the probes that perform the actual collection of the system data and store the data in a common collection repository. Subclasses are provided to implement the collection of different types of system data. Thus, the preferred embodiment provides an extensible and flexible solution to the problem of collecting and analyzing different types of system data.