The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2003
Filed:
Mar. 10, 2000
Meera Sampath, Penfield, NY (US);
Ashok Godambe, Pittsford, NY (US);
Eric Jackson, Penfield, NY (US);
Edward W. Mallow, Henrietta, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
Through a combination of a hybrid diagnostic scheme based on qualitative and quantitative technologies, at least component level status information can be obtained about a machine, such as an electronic device. In particular, qualitative model based diagnostic technologies is used in conjunction with quantitative analysis techniques and signature analysis to achieve accurate and reliable diagnosis of components and systems down to the individual component level, for example, down to the consumer replaceable unit level. Thus, the hybrid diagnostic methodology exploits the diagnostic information content in already available system signals via intelligent processing and allows for diagnosis with minimal sensor requirements. Furthermore, the diagnostic methodology allows for a self-diagnosing machine having diagnostic intelligence which in turn can reduce service time, service costs, increased machine up time and improve customer satisfaction.