The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2003

Filed:

May. 09, 2000
Applicant:
Inventors:

Lucille A. Giannuzzi, Winter Park, FL (US);

Frederick A. Stevie, Orlando, FL (US);

Cathrine Vartuli, Windermere, FL (US);

Assignee:

Agere Systems Inc, Allentown, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

The present invention provides a method of testing an unknown sample with an analytical tool The method may include calibrating an analytical tool to a calibration standard having a known concentration of an element therein and obtained with a focused beam, thereby to achieve a calibrated analytical tool, determining an unknown concentration of the element within the unknown sample with the calibrated analytical tool, and correcting the unknown concentration with the calibration standard.


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