The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2003
Filed:
Dec. 22, 2000
Hitachi Medical Corporation, Tokyo, JP;
Abstract
An X-ray based measuring device of the invention includes: X-ray imaging means ( ) which have their detection areas divided into a plurality of detector units ( to ′), detect X-rays transmitted through an inspection object ( ), and pick up X-ray images in interested areas ( ′) of the inspection object; conversion means ( ) for converting analog image signals read from the detector units into digital image data under specified conversion conditions for each of the detector units; and re-conversion means ( ) for converting the digital image data obtained for each of the detector units under re-conversion conditions corresponding to the specified conversion conditions, wherein analog image signals are A/D converted into digital image data under optimum conversion conditions for each detector unit, and X-ray images in interested areas of the inspection object are sequentially picked up.