The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2003
Filed:
Dec. 22, 2000
Hidemi Takayama, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An optical scanning apparatus has an incident optical system for causing a light beam from a light source to be obliquely incident in a sub-scanning cross-section on a deflecting surface of an optical deflector, and an imaging optical system for forming, on a scanned surface, an image of the light beam deflected by the deflecting surface. Letting K be the recording density in a main scanning direction on the scanned surface, &ggr; be the absolute value of a maximum difference in a tilt angle between the deflecting surfaces in the sub-scanning cross-section, &agr; be the incident angle of the light beam incident on the deflecting surface in the sub-scanning cross-section, &thgr; be the scanning angle of an most off-axis light beam with respect to the optical axis of the imaging optical system in a main scanning cross-section, f be the focal length of the imaging optical system, and &phgr; be the angle a scanning central axis makes with an optical axis when the optical axis of the incident optical system opposing the deflecting surface is projected to the main scanning cross-section, a predetermined condition is satisfied.