The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2003
Filed:
Feb. 18, 1999
Wolfgang Holzapfel, Obing, DE;
Elmar Mayer, Tacherting/Reit, DE;
Siegfried Reichhuber, Stein/Traun, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
A scanning unit for an optical position measuring device, which is suited for optically scanning a scale graduation, to produce positionally dependent scanning signals on the basis of scale graduation. The scanning unit includes a carrier element, at least one optoelectronic component, which is arranged on the carrier element, a radiation-sensitive or a radiation-emitting surface region of the component being oriented to face away from the carrier element. Provision is also made for at least one electrically conductive connector lead between the carrier element and a contacting region of the component. An at least semi-transparent cover element is arranged directly on the radiation-sensitive and/or radiation-emitting surface region of the component. In this case, the cover element is arranged in such a way with respect to the component that the contacting region of the component is not covered by it and, in addition, the thickness of the cover element is selected so as to ensure that the top side of the cover element exceeds the height of the connector lead in the contacting region.