The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2003

Filed:

Jul. 30, 2001
Applicant:
Inventors:

Miha Fuderer, Eindhoven, NL;

Johan Samuel Van Den Brink, Eindhoven, NL;

Michel Paul Jurriaan Jurrissen, Eindhoven, NL;

Arianne Margarethe Corinne Van Muiswinkel, Eindhoven, NL;

Ulrich Katscher, Norderstedt, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

A magnetic resonance imaging method employs sub-sampled signal acquisition from a number of receiver coils such as surface coils. A full field-of-view magnetic resonance image is reconstructed on the basis of the sensitivity profiles of the receiver coils, for example on the basis of the SENSE technique. The reconstruction is carried out mathematically as an optimization, for example, requiring a minimum noise level in the magnetic resonance image. According to the invention, a priori information is also involved in the reconstruction and the a priori information is taken into account especially as a constraint in optimization.


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