The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2003
Filed:
Oct. 26, 2000
Yawen Yang, Newark, CA (US);
Tzong-Shinn Jiang, San Jose, CA (US);
Tera Fiberoptics, Inc., Fremont, CA (US);
Abstract
Method and system for constructing and testing integrity of a combination of first and second spaced apart optical fiber couplers that each receive and hold two fibers. A segment of each fiber in a separation region between the couplers is heated, twisted and elongated by selected amounts to form a fiber complex, located between the first and second couplers. The fibers in the second coupler are subjected to further controlled elongation. A spectrum analyzer receives a common light beam passed through each of the two fibers and fiber couplers and measures successive maximum and minimum values of an interferometric variable IF and pit-to-pit or peak-to-peak spacing of the IF values as fiber segment elongation is varied. If (1) successive maximum values lie within an envelope of selected (small) width, (2) differences between successive maximum and minimum values are at least equal to a selected threshold value, and (3) pit-to-pit or peak-to-peak spacing is close to a selected spacing standard, the combination is accepted as part of a Mach-Zehnder-type interferometer.