The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2003

Filed:

Nov. 17, 2000
Applicant:
Inventors:

Masaaki Hirata, Osaka, JP;

Ryuichi Yamaguchi, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A method of accurately estimating a time delay caused by a target cell where a target supply voltage is applied to the cell. Time delays, caused by a representative cell, are represented as a function of supply voltages applied to the cell, thereby deriving an approximation function k . An interpolation function k is derived from the approximation function k by reference to two points P and P . P indicates a time delay T caused by the target cell where a supply voltage V is applied thereto, while P indicates a time delay T caused by the target cell where a different supply voltage V is applied thereto. Thus, the interpolation function k represents the time delays caused by the target cell as a function of supply voltages. And by using this interpolation function k , a time delay caused by the target cell at the target supply voltage can be estimated accurately.


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