The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2003
Filed:
Apr. 04, 2000
Beat Aebischer, Heerbrugg, CH;
Christian Betschon, Heiden, CH;
Bernhard Gächter, Balgach, CH;
Georg Orawez, Diepoldsau, CH;
Ernst Ramseier, Widnau, CH;
Esther Rutishauser, Wolfhalden, CH;
Leica Geosystems AG, Heerbrugg, CH;
Abstract
To measure the distance to targets, local maxima exceeding a threshold (&egr;) and being associated with a correlation function (f) are determined, the reference values of which are obtained from scalar products of a received signal (e), produced by reflections of an optical pulse by the targets, and number of comparison functions, copies of a reference function (r) which are shifted as a function of time, and the transit times of the reflections are derived from the time-related shifts of the corresponding comparison functions. By interpolation with respect to the time-related shifts or optimization thereof, for example by adjusting them so that the orthogonal distance of the received signal (e) from the vector space which is spanned by the corresponding comparison functions is a minimum, the transit times can be determined even more accurately.