The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2003

Filed:

Dec. 15, 1999
Applicant:
Inventors:

Cheng-Youn Lu, Cresskill, NJ (US);

Randall Bret Perlow, Aliso Viejo, CA (US);

Charles Reed, Jr., Yardley, PA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 5/12 ; H04L 2/738 ;
U.S. Cl.
CPC ...
H04L 5/12 ; H04L 2/738 ;
Abstract

Method and apparatus for determining the correct set of samples to retain in applying a decimation process. The present method provides an automatic approach to determine the timing phase of the desired samples to decimate the oversampled input signal (data sequence), thereby producing the underlying data signal.


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