The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2003
Filed:
Dec. 20, 2001
Applicant:
Inventors:
John Border, Walworth, NY (US);
Susan H. Bernegger, Fairport, NY (US);
John C. Pulver, Spencerport, NY (US);
Morgan A. Smith, Rochester, NY (US);
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/710 ; G02F 1/1335 ;
U.S. Cl.
CPC ...
G02B 2/710 ; G02F 1/1335 ;
Abstract
A microlens array has a plurality of microlens supportedly arranged on a first surface of a transparent medium. At least two optical features are formed on a second surface opposite the first surface. Fiducial marks are formed on the second surface by a beam of collimated light directed onto the optical features and focused onto the second surface. Fiducial marks enable precise alignment of the microlenses in the microlens array.