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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6515476 B1

PDFFull Text
Date of Patent:
Feb. 04, 2003

Filed:

May. 22, 2000

Magnetic field inhomogeneity measurement method and apparatus, phase correction method and apparatus, and magnetic resonance imaging apparatus

Applicant:
Inventors:

Koichi Oshio, Tokyo, JP;

Mitsuharu Miyoshi, Tokyo, JP;

Assignee:

GE Yokogawa Medical Systems, Limited, Tokyo, JP;

Attorney:

Moonray Kojima

Primary Examiner:

Edward Lefkowitz

Assistant Examiner:

Dixomara Vargas

Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

In order to perform imaging with water and fat separated in an efficient manner, a tomographic image is obtained having a phase difference of &pgr;/2 between water and fat using magnetic resonance ( ), the phase of the tomographic image is multiplied by n ( ), the phase after being corrected for wraparound is multiplied by 1/n ( ), and a phase image representing magnetic field inhomogeneity is generated. The tomographic image is corrected for phase using the phase image ( ), and is separated into a water image and a fat image ( ).

Find Patent Forward Citations

Oshio, Koichi. (2003). Magnetic field inhomogeneity measurement method and apparatus, phase correction method and apparatus, and magnetic resonance imaging apparatus (U.S. Patent No. 6515476). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6515476

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