The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2003
Filed:
Dec. 10, 1999
Peet Kask, Harku, EE;
Evotec Biosystems AG, Hamburg, DE;
Abstract
A method for characterizing a sample involves: a) monitoring the sample for intensity fluctuations of radiation emitted, scattered and/or reflected by units of the sample in at least one measurement volume with at least one detector which is able to detect radiation emitted, scattered and/or reflected by the units, b) determining from the intensity fluctuations intermediate statistical data of an at least two-dimensional joint statistical function, and c) determining information related to a joint distribution of the units out of the intermediate statistical data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile