The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2003

Filed:

Jul. 20, 2001
Applicant:
Inventors:

Sheikh Kaisar Alam, Somerset, NJ (US);

Ernest J. Feleppa, Rye, NY (US);

Frederic L. Lizzi, Tenafly, NJ (US);

Assignee:

Riverside Research Institute, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 ;
U.S. Cl.
CPC ...
A61B 8/00 ;
Abstract

Improved methods of signal processing for generating estimates of tissue strain are presented. These techniques generally employ the frequency shifting of post-compression spectral data to determine a scaling factor which approximates the applied tissue strain. The scaling factor can be determined by finding the maximum correlation between the frequency shifted post-compression data to the pre-compression data and can also be determined by minimizing the variance of the ratio of such data. Correlation tracking and maximum correlation magnitude techniques for improving the results of elastography are also presented.


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