The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2003

Filed:

Feb. 16, 2001
Applicant:
Inventors:

Tsuyoshi Anno, Hamura, JP;

Takahiro Gotou, Kodaira, JP;

Hiroki Kunitake, Kodaira, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E01G 2/300 ; G01M 1/702 ;
U.S. Cl.
CPC ...
E01G 2/300 ; G01M 1/702 ;
Abstract

A high speed uniformity measurement device is provided in which high speed uniformity of a tire conveyed on a production line is measured automatically and continuously. At the high speed uniformity measurement device, a lower spindle is disposed so as to be movable up and down, and a lower side half rim is mounted to a distal end of the lower spindle. An upper spindle is provided, and a sensor for measuring high speed uniformity is provided at the upper spindle. An upper side half rim is mounted to a lower end of the upper spindle. A lock and unlock mechanism, for locking and unlocking the half rim, is formed at an upper side of the lower side half rim and at a lower side of the upper side half rim.


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