The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
Sep. 01, 2000
Mark Che-hung Chan, San Diego, CA (US);
Steven William Griffith, San Diego, CA (US);
Alan Ward Jelden, Vista, CA (US);
Syntricity, Inc., San Diego, CA (US);
Abstract
A technique for efficiently structuring a database takes advantage of redundancy in data point conditions to reduce the time associated with the insertion of data points into a database and to reduce the amount of required storage space. The technique is particularly suited for semiconductor characterization data having a large number of test data points collected under repeated test conditions. The data point conditions are analyzed to inventory the different unique conditions associated with the given set of data points. Each unique combination of conditions is assigned a variable array, and each variable array element identifies a specific condition. The data point values are linked to variable set handles that represent the different variable arrays. In this manner, the data points can be inserted into the database without having to store each data point value with all of the corresponding conditions. Rather, the data point values are stored along with their respective variable set handles. The present invention also provides techniques for data extraction, management, and analysis, along with a database management system configured to carry out the various techniques.