The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2003

Filed:

Apr. 20, 2001
Applicant:
Inventor:

Takaaki Murao, Yokohama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/22 ;
U.S. Cl.
CPC ...
G01B 3/22 ;
Abstract

Through comparison of electronic shape data for parts, the invention automatically detects a difference in shapes of products due to the design change, and/or searches for a product that is similar in shape. A shape analysis system comprises: an analysis tree node generator; a neighbor graph generator, for creating an edge between the nodes that are generated by the analysis tree node generator and that are geometrically adjacent, so as to produce a neighbor graph; and an analysis tree generator, for merging nodes in the neighbor graph that are generated by the neighbor graph generator and that are connected by the edge, for generating a new node in correlation with a 3d-shape that encloses patches included in the merged nodes and a shape analysis tree wherein the node acquired by merging is defined as a parent node and the other nodes, before being merged, are defined as child nodes.


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