The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
Mar. 26, 1999
Applicant:
Inventors:
Mark Deome, San Jose, CA (US);
Donald V. Organ, Saratoga, CA (US);
Assignee:
LTX Corporation, Westwood, MA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract
An automated test system that has analog and digital resources for testing mixed signal ICs. A control pattern is provided that is used by the automated test system to simultaneously control both the digital resources and the analog resources. The control pattern is comprised of a sequentially executed two-dimensional array with columns corresponding to analog and digital resources. The automated test system uses the control pattern to control both the analog and digital resources.
Deome, Mark. (2003). Generating and controlling analog and digital signals on a mixed signal test system (U.S. Patent No. 6512989). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6512989
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile