The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
Mar. 03, 1999
Takao Minami, Tokyo, JP;
Nobuaki Takeuchi, Tokyo, JP;
Keiichi Shimizu, Osaka, JP;
Koichi Shinozaki, Osaka, JP;
Takamu Genji, Osaka, JP;
Other;
Abstract
A multi-branch optical network testing method (or device) is provided to perform a fault isolation test on an optical network that branches off at a branch point by a number of optical lines having terminal ends respectively. Herein, optical pulses are input to the optical network, from which they are returned as reflection beams. Then, response beams corresponding to mixture of the reflection beams are converted to OTDR waveform data representing a waveform whose optical power gradually decreases in accordance with a distance from an OTDR measurement device and which has a number of reflection peaks. The OTDR waveform data are subjected to logarithmic conversion to produce logarithmic waveform data representing a logarithmic waveform. An approximation method of least squares is effected on the logarithmic waveform data to produce an approximation line, which crosses the logarithmic waveform at points of intersection corresponding to Fresnel reflection points. Using the Fresnel reflection points as split points to split the OTDR waveform data into a number of ranges. Attenuation constants are repeatedly calculated with respect to each of the ranges every measurement time and are stored in a storage device. Thereafter, fault determination is automatically performed based on the attenuation constants stored in the storage device with respect to the fault occurrence time, fault occurrence line and fault occurrence distance.