The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
Jun. 29, 1998
Applicant:
Inventors:
Mark E. O'Loughlin, Galloway, OH (US);
Allan H. Clauer, Worthington, OH (US);
David W. Sokol, Dublin, OH (US);
Jeffrey L. Dulaney, Dublin, OH (US);
Steven M. Toller, Grove City, OH (US);
Assignee:
LSP Technologies, Inc., Dublin, OH (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/100 ; B05D 3/00 ; C21D 1/54 ;
U.S. Cl.
CPC ...
G01B 1/100 ; B05D 3/00 ; C21D 1/54 ;
Abstract
A method of testing the operation of a laser peening system includes providing a sensor in a possible laser beam path, applying a transparent overlay material to the sensor, directing a pulse of coherent energy to the sensor through the transparent overlay material to create a shock wave, and determining a characteristic of the created shock wave with the sensor.