The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
May. 17, 2000
Hirofumi Sonoyama, Kodaira, JP;
Yoshiki Kawajiri, Musashino, JP;
Masashi Wada, Kodaira, JP;
Jun Eto, Oita, JP;
Shinji Kawai, Itami, JP;
Other;
Abstract
The reliability of a semiconductor integrated circuit device is remarkably improved by minimizing the fluctuations of the detection level of the supply voltage due to the manufacturing process and/or other factors. In the semiconductor integrated circuit device according to the invention, a differential amplifier circuit SA amplifies the differential voltage representing the difference between the reference voltage V generated by a reference voltage generating section and the detection voltage obtained by dividing a supply voltage V by means of resistors and and outputs it as a detection signal K. The reference voltage generating section generates reference voltage V from the base-emitter voltage of a bipolar transistor that is minimally affected by temperature and the manufacturing process so that the fluctuations of the detection level of the supply voltage V can be minimized.