The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2003

Filed:

Jan. 11, 2000
Applicant:
Inventor:

Yasuharu Iwaki, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/186 ;
U.S. Cl.
CPC ...
G01N 2/186 ;
Abstract

An image reading method and apparatus allow reading light to be incident on a film to obtain projected light and read the thus obtained projected light photoelectrically to perform reading of an image recorded on the film. In the method and apparatus, at least one of a scratch and a foreign matter on the film is detected based on two respective reading results obtained using types of reading light in different states of diffusion such as a parallel light and a perfectly diffused light from two light sources, respectively. The method and apparatus are capable of surely detecting a scratch on the film, or dirt or foreign matter adhered to the film and correcting it as required, whereupon high-quality images having no image deterioration due to the scratch, the dirt or foreign matter can be reproduced in a consistent manner.


Find Patent Forward Citations

Iwaki, Yasuharu. (2003). Method and apparatus for image reading capable of detecting scratches or foreign matter on film (U.S. Patent No. 6512238). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6512238

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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