The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
May. 08, 2001
Michael D. Sherar, Toronto, CA;
Gregory J. Czarnota, Mississauga, CA;
John Hunt, Toronto, CA;
Michael Kolios, Toronto, CA;
University Health Network, Toronto, CA;
Abstract
A non-invasive method of monitoring apoptosis in cell culture, ex-vivo tissues and in-vivo tissues using high frequency ultrasound imaging is provided. The method includes the steps of: 1) imaging a selected site of the cell culture or tissues using high frequency (above 20 MHz) ultrasound imaging (before image); 2) exposing the selected site to an apoptosis-inducing stress; 3) imaging the selected site or a portion thereof, using ultrasound imaging at subsequent timed intervals (after image(s)); 4) measuring the signal amplitude of a region of interest of the selected site in the before and after images; 5) comparing the signal amplitude measurements for the regions of interest in the before and after images and determining whether the after image regions exhibit an increase in amplitude as compared to the before image regions which is an indication that apoptosis has begun; and 6) measuring the change in the frequency spectrum of the radiofrequency ultrasound backscatter signal in the region of interest in the before and after images and confirming that apoptosis has begun when the slope of the frequency spectrum has increased.