The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
Oct. 19, 1999
Nicholas James Levinos, Hampton, NJ (US);
Stephen Reid Popielarski, Narberth, PA (US);
Agere Systems Inc., Miami Lakes, FL (US);
Abstract
An apparatus for measuring thermomechanical properties of a photo-sensitive material sample during exposure of the sample material to a light source includes a sample holder having a sample support positionable in a sample holding area of the sample holder for holding the photo-sensitive material sample, a probe disposable relative to the sample support for measuring the thermomechanical properties of the photo-sensitive material sample, a temperature control unit having a cavity for receiving the sample holder and for maintaining the sample holder within a selectively-controlled temperature range, and an illuminating assembly operatively arranged for directing a light signal onto the sample holder for illuminating the photo-sensitive material held on the sample holder.