The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
Aug. 09, 2000
Applicant:
Inventors:
Chih-Kung Lee, Taipei, TW;
Chih-Ting Lin, Taipei, TW;
Wen-Hsin Hsiao, Taichung, TW;
Hsueh-Ching Shih, Taipei, TW;
Assignee:
National Science Council, Taipei, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 4/1047 ; G01P 1/509 ; G01H 1/108 ;
U.S. Cl.
CPC ...
H01L 4/1047 ; G01P 1/509 ; G01H 1/108 ;
Abstract
The present invention discloses a vibration measuring device for measuring a vibration of an object. Such device includes a sensing body generating a dynamic information in response to the vibration, and a piezoelectric sensing layer disposed on the sensing body to construct a sensor and formed in a distributed mode to measure the dynamic information in a selected specific bandwidth. The present invention also discloses a vibration measuring method.