The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
Dec. 03, 1998
Applicant:
Inventor:
Peter Feller, Benglen, CH;
Assignee:
Zellweger Luwa AG, Uster, CH;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 5/04 ; G01N 2/186 ;
U.S. Cl.
CPC ...
G01L 5/04 ; G01N 2/186 ;
Abstract
The invention relates to a method for assessing the effect of yarn defects on textile fabrics, which are to be produced from a given yarn, by simulating an image of the fabric. So that assessment of simulated textile fabrics may be carried out with greater reliability and more easily, a first image ( ) of the fabric is generated by simulation based on parameters or measured signals of the given yarn. A second image ( ) of the fabric is generated by simulation based on parameters of a reference yarn and finally the first image is compared with the second image.