The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2003

Filed:

Apr. 02, 2001
Applicant:
Inventors:

Kazuya Kiyoi, Tondabayashi, JP;

Katsutoshi Tsurutani, Osaka, JP;

Assignee:

Minolta Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/124 ; G01B 1/130 ;
U.S. Cl.
CPC ...
G01B 1/124 ; G01B 1/130 ;
Abstract

The present invention provides a three-dimensional measuring apparatus comprising a light projector for projecting light to an object, a light receiving element, a light receiving optical system for leading light projected on and then reflected by the object to the light receiving element, and a calculator for obtaining measured data for three-dimensional shape measurement based on signals output from the light receiving element. The light receiving optical system includes a first optical filter which transmits only light having substantially the same range of wavelengths as that of the light projected from the light projector, at least one second optical filter which transmits light having a different range of wavelengths as that of the first optical filter and a filter selector which selectively locates one of the first optical filter or the second filter or filters at an optical path of the light receiving optical system.


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