The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2003

Filed:

Feb. 26, 2001
Applicant:
Inventors:

Kouichi Suzuki, Tokyo, JP;

Yoshikazu Inoue, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E01C 2/301 ;
U.S. Cl.
CPC ...
E01C 2/301 ;
Abstract

A running type road surface shape measuring apparatus for measuring the unevenness and grade of road surface in the longitudinal and transverse directions during running of vehicle comprises a vehicle body ( ), on which two running wheels ( ) and one measuring wheel ( ) are supported rotatably in series, said measuring wheels ( ) is located movably in the upward and downward direction between said two running wheels ( ), and an ancillary wheel ( ) is rotatably mounted on said body ( ) in parallel to said measuring wheel ( ). The measuring wheel ( ) is provided with a displacement measuring sensor ( ) for measuring a displacement in upward and downward directions of said measuring wheel ( ) and a distance measuring encoder ( ) for measuring a moving distance of said measuring wheel ( ), and said vehicle body ( ) is provided with an angle measuring sensor ( ) for measuring a grade of road surface.


Find Patent Forward Citations

Loading…