The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2003

Filed:

Jun. 30, 2000
Applicant:
Inventors:

Roy Smythe Bass, Jr., Essex Junction, VT (US);

Stephen Larry Runyon, Pflugerville, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A method and system are disclosed for improving a yield of circuits produced from a semiconductor wafer. A plurality of design rules are established for designing a layout of the circuit within the wafer. A yield-limiting set of the plurality of design rules are selected. Adherence to each of the set of rules throughout all of the layout reduces the yield. For each one of the set of rules, a recommended value is determined. A percentage of occasions each one of the set should be exceeded within the layout is also determined. The layout is then designed so that each one of the set of the plurality of design rules meets or exceeds the recommended value more often than the percentage.


Find Patent Forward Citations

Loading…