The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2003
Filed:
Jul. 10, 2000
James Grey, Cedar Park, TX (US);
Scott Richardson, Cedar Park, TX (US);
Patrick Williams, Cedar Park, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A system and method for importing and exporting test executive values from or to a database. A test executive may provide the user various places, referred to as variables and properties, in which data values can be stored. These data values may affect execution of a test executive sequence. Variables may be global to a sequence file or local to a particular sequence. Each step in a sequence can have properties. The user may include a Property Loader step in a sequence, which is operable to dynamically, i.e., at run time, load property and/or variable values from a database. The Property Loader step may be placed in a setup group of the sequence, and the step(s) whose properties are configured may be placed in a main group of the sequence, so that when the sequence is executed the steps in the main group are configured with appropriate property values before running. The test executive may also enable a user to interactively, e.g., through a user interface menu item, request variable and property values associated with a sequence to be imported from or exported to a database. For example, after exporting values to a database, the values may later be used to dynamically configure a test executive sequence.