The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2003

Filed:

Mar. 05, 1999
Applicant:
Inventor:

Takefumi Namiki, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/300 ;
U.S. Cl.
CPC ...
G01R 1/300 ;
Abstract

An electromagnetic wave analyzer which numerically analyzes the behavior of electromagnetic waves at a higher computation speed, even when the object model has fine geometrical features. An analysis command input unit produces a command to initiate a simulation. Upon receipt of this command, an analyzing unit starts to calculate electromagnetic field components with an alternating direction implicit FD-TD method. The analyzing unit divides each time step into a first-half and second-half stages and alternately executes their respective operations.


Find Patent Forward Citations

Namiki, Takefumi. (2003). Electromagnetic wave analyzer and computer-readable medium storing programs for electromagnetic wave analysis (U.S. Patent No. 6507795). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6507795

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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