The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2003

Filed:

Apr. 11, 2001
Applicant:
Inventors:

Jason Mecham, Maple Valley, WA (US);

Steve Lytle, Woodinville, WA (US);

Assignee:

Westover Scientific, Inc., Woodinville, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/100 ;
Abstract

A method and apparatus for preventing excessive closure between a retractable tip objective and the stage of a microscope which includes positioning a sensor in the turret of a microscope, which sensor is capable of detecting excessive retracting of the retractable tip into the body of the objective, and providing a controller for monitoring the sensor for such excessive retracting and issuing an alert in response to the detection of an event of such excessive retracting. The alert may be made by way of an audio output, or by a visual cue or both. Extinguishing the lamp of the microscope is a preferred visual cue, as the excessive retracting of the retractable tip is generally caused by a focusing error, and the extinguishing of the light source reduces or eliminates the ability of the user of the microscope to focus the microscope, thus attracting his or her attention.


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