The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2003
Filed:
Jun. 08, 2000
Fumiya Yagi, Toyonaka, JP;
Eiichi Ide, Itami, JP;
Hiroshi Uchino, Kyoto, JP;
Koichi Kamon, Takatsuki, JP;
Takashi Kondo, Sakai, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
An object is to provide a three-dimensional data input apparatus that enables data currently required by the user to be easily extracted from the stored past three-dimensional data, shooting position data or shooting direction data. When the user provides the three-dimensional measuring device with a measurement instruction, the portions operate through control by the central processing portion to obtain the three-dimensional data SS and the two-dimensional image data SN of the object Q. The group of the three-dimensional data SS, the two-dimensional image data SN, the position data SP and the attitude data SA that are in the one-to-one correspondence with one another as described above are stored in the storage portion every time the three-dimensional data of the object Q is measured. In a case where a fixed point observation of the object is repetitively performed by use of the three-dimensional measuring device by extracting from the storage portion three-dimensional data SSK and two-dimensional image data SNK obtained in the past and comparing them with the present three-dimensional data SSG and two-dimensional image data SNG, the change in the configuration of the object during that period can be found.