The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2003

Filed:

May. 03, 2001
Applicant:
Inventors:

Daniel S. Purdy, Falls Church, VA (US);

Jeffrey M. Ashe, Gloversville, NY (US);

Erik Lier, Newtown, PA (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 3/02 ;
U.S. Cl.
CPC ...
H01Q 3/02 ;
Abstract

A system and method to individually characterize all of the antenna elements or amplifiers in an array antenna system simultaneously, without the need to perform sequential measurements. A positioning device allows movement of the antenna with respect to a calibration probe or movement of the calibration probe with respect to the antenna. Multiple simultaneous control circuit encoding (CCE) measurements of each of the array elements in an array antenna are performed. A second aspect of the system and method involves changes in the level of signals transmitted by the amplifiers in the elements of an array antenna system in conjunction with the use of orthogonal coding measurements. Changes in the level of signals transmitted permits simultaneous measurement of the amplifier characteristics of each of the array elements in an array antenna.


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