The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2003

Filed:

Dec. 21, 2001
Applicant:
Inventors:

Ron Meek, Shawnee, KS (US);

William E. Thurston, Kansas City, MO (US);

Assignee:

Interconnect Devices, Inc., Kansas City, KS (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R 1/324 ;
U.S. Cl.
CPC ...
H01R 1/324 ;
Abstract

An electrical contact interface consists of a probe formed by a pair of oppositely extending plungers each having a contact tip, an inner shoulder and a rearwardly extending shaft terminating in a lug end. A coil spring is sleeved about the opposed plungers and is positioned between the opposite inner shoulders with the shafts extending toward each other and in constant sliding engagement with each other through the lug ends. The lug ends abut each other at an extreme travel relation of the plungers and prevent mutual disengagement of the plungers from within the coil spring. The probe is mounted in a fixture or other intermediate structure for positioning between circuit contacts. The probe finds particular use in applications requiring robust design and in which electrical contact must be maintained.


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