The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2003
Filed:
Sep. 17, 1999
Kenneth A. Wollermann, Mukwonago, WI (US);
Artos Engineering Company, Waukesha, WI (US);
Abstract
A method for calibrating a crimping press for crimping terminals on an electrical conductor. A master tool is positioned in a test crimping press and the press is operated to crimp a test bar to a desired crimp height. During the process of crimping the test bar to the desired crimp height, a standard force profile is generated. The standard force profile is recorded in a control unit. The master tool is transferred to a crimping press to be calibrated. Once the master tool is in place, the crimping press is operated until the crimping press creates a crimp height on the test bar equal to the desired crimp height. During the crimping process that results in the desired crimp height, an actual force profile is determined for the crimping press being calibrated. The actual force profile is compared to the standard force profile and the actual force profile is adjusted by an offset factor such that the adjusted force profile replicates the standard force profile. The calculated offset factor is then used to standardize the output of the load sensor such that an ideal force profile can be used during operation of the crimping press to perform crimp quality monitoring without additional calibration.