The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2003
Filed:
Aug. 07, 2000
Todd Haber, Alpharetta, GA (US);
Kevin Hsu, Roswell, GA (US);
Calvin M. Miller, Naples, FL (US);
Jeff W. Miller, Kennesaw, GA (US);
Micron Optics, Inc., Atlanta, GA (US);
Abstract
A method for calibrating tunable optical filters, calibrated tunable filters and devices employing such filters. The method is of particular use with fiber Fabry-Perot tunable filters and more particularly for filters which employ piezoelectric transducers as tuning elements. Sets of calibration coefficients are generated which span the wavelength region and operating temperature range of the filter. Calibrated tunable filters are combined with a means for storing the sets of calibration coefficients and means for correcting wavelength measurements using the sets of coefficients in devices which measure wavelengths of light. The sets of calibration coefficients can also be used to tune the filter to pass a selected wavelength of interest.