The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2003

Filed:

Apr. 09, 2001
Applicant:
Inventors:

Alfred Ross, Lörrach, DE;

Götz Schlotterbeck, Efringen-Kirchen, DE;

Hans Senn, Windisch, CH;

Assignee:

Hoffmann-La Roche Inc., Nutley, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

For simultaneously determining the analytical NMR spectra of a number of samples placed suitably arranged in the measuring site of an NMR measuring apparatus, spatially and timely varying magnetic fields are used. The resulting signals are spatially resolved by a suited processing, for example Fourier transform. Surprisingly, from these signals, analytical NMRs of high resolution can be obtained for each sample. The method can be applied to two-dimensional arrangements of samples, for example a bundle of capillaries imitating a conventional NMR sample tube or a well plate, or three-dimensional arrangements, for example stacks of well plates. The method allows the determination of NMR spectra for analysis or for comparison with anterior spectra for long time behavior studies and quality assessment with only a fraction of time needed for measuring the samples individually.


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