The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2003
Filed:
Oct. 03, 2001
Lingnan Liu, Mill Creek, WA (US);
Lars Jonas Olsson, Woodinville, WA (US);
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
Extended field of view (panoramic) ultrasonic images can exhibit dimensional distortion due to the interplay of the direction and speed of scanhead motion and the direction and rate of beam scanning. This distortion can result in measurement inaccuracies when making measurements of anatomy or distances in the panoramic image. This distortional inaccuracy is compensated by adjusting the alignment of elemental images as they are aligned to produce the panoramic images in consideration of the estimated amount of distortion. The technique can be applied to either linear or curved array transducers and to linear or sector scan formats.