The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2002
Filed:
Aug. 31, 1999
Hong-Beom Pyeon, Choongcheongbuk-Do, KR;
Hyundai Micro Electronics Co., Ltd., Choongcheongbuk-Do, KR;
Abstract
A memory test circuit in a test mode divides a plurality of mats forming a memory and coupled with identical global input/output lines into even and odd-numbered mats and simultaneously activates the even or odd-numbered mats. The memory test circuit sequentially amplifies the activated even or odd-numbered mats, and simultaneously compares the amplified mats in a latch unit, which decreases the memory test time. The memory test circuit can further include a mat controlling unit for dividing a plurality of mats into even and odd-numbered units and simultaneously controlling the even or odd-numbered mats, a mat switch controlling unit for controlling a plurality of mat switches to be sequentially operated, a main amp controlling unit for controlling a plurality of main amps to be sequentially operated, and a latch unit for latching data amplified by the plurality of main amps to be simultaneously outputted.