The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2002
Filed:
Dec. 30, 1999
Korea Kumbo Petrochemical Co. Ltd, Seoul, KR;
Abstract
A method of measuring impedance is based on carrier function Laplace transform. The measurement includes detecting a response signal from a device under test, to which signal an excitation such as a pulse, interrupt or constant load is applied. Resulting data is fitted to a carrier function, selected so as to be capable of providing a good fit and for which an analytical Laplace transform is known, in order to obtain parameters of such function providing best fit. Obtained parameters are further substituted into the analytical expression of Laplace transform of carrier function which is used to calculate a frequency dependent impedance function in the Laplace domain. The resulting impedance function is used for calculating the impedance spectrum in a frequency domain and for calculating the measurement error of the frequency domain impedance spectrum using the standard deviations of the parameters, obtained during fitting of time-domain data.