The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2002
Filed:
Dec. 29, 1999
Rajiv Gupta, New York, NY (US);
Christopher James Daily, Ogden, UT (US);
Rasiklal Punjalal Shah, Latham, NY (US);
Valtino Xavier Afonso, DesPlaines, IL (US);
General Electric Company, Schenectady, NY (US);
Abstract
A system for performing image-based diagnosis of a machine includes a database containing a plurality of historical images taken from a plurality of machines, a diagnostic unit configured to diagnose a new artifact image from the machine and to communicate historical and non-historical images or data associated with the system to a remote facility. The plurality of historical images include a plurality of ideal images generated from the plurality of machines using all possible machine settings and a plurality of artifact images generated from the plurality of machines, each of the artifact images having known faults associated therewith and a corresponding corrective action for repairing the faults. The diagnostic unit includes a diagnostic image processor and a diagnostic fault isolator. The diagnostic image processor includes means for finding an ideal image from the plurality of historical images that most closely matches the new artifact image, means for assigning an artifact category to the new artifact image based on the matched ideal image, and means for extracting an artifact feature from the new artifact image according to the assigned category. The diagnostic fault isolator includes means for generating a plurality of metrics for the extracted artifact feature and means for applying the plurality of metrics to identify an artifact image from the plurality of historical images that most closely matches the new artifact image and a corrective action for repairing the unknown fault.