The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2002
Filed:
Jun. 18, 2001
Rudolf Oldenbourg, Falmouth, MA (US);
Cambridge Research & Instrumentation Inc., Woburn, MA (US);
Abstract
A method for measuring sample retardance in the presence of spurious background retardance contributed by optical components such as strained lenses in the measurement system, which is accurate where there is a retardance in excess of 15 degrees in the sample, the background, or the combination thereof. The method can be applied to imaging systems that record polarized light intensities for obtaining retardance magnitude and angular orientation values at all points in a scene simultaneously. The system first takes images that record the apparent slow axis orientation and the apparent retardance of the sample at all image points. Then the sample is removed and images are taken that record the background retardance alone. Algorithms for minimizing the effect of the background retardance on the measured sample retardance make use of the separately measured polarized light intensities of sample with background and of the background alone. The algorithms can be applied to each picture element simultaneously and do not make use of spatial relationships or distributions within the sample.