The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2002
Filed:
May. 05, 2000
Applicant:
Inventor:
Adam Weiss, Pickering, CA;
Assignee:
Photon Dynamics Canada Inc., Markham, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/188 ;
U.S. Cl.
CPC ...
G01N 2/188 ;
Abstract
An inspection system for the edge of a sheet of glass e.g. automobile glass. The system has at least one laser, with the laser beam directed at the edge of the glass. Light reflected from the edge is recorded e.g. with a camera. The path length from the laser to the glass edge and back to the camera is maintained constant as the glass moves through the apparatus.
Weiss, Adam. (2002). Inspection system for edges of glass (U.S. Patent No. 6501546). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6501546
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile