The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2002

Filed:

Dec. 29, 1999
Applicant:
Inventors:

Wayne D. Jung, Morton Grove, IL (US);

Russell W. Jung, Morton Grove, IL (US);

Alan R. Loudermilk, Chicago, IL (US);

Assignee:

LJ Laboratories, LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ; G01N 2/125 ; G01N 2/155 ; G01N 2/147 ;
U.S. Cl.
CPC ...
G01N 2/100 ; G01N 2/125 ; G01N 2/155 ; G01N 2/147 ;
Abstract

Optical characteristic measuring systems and methods for determining the color or other optical characteristics of teeth comprising a probe body ( ) wherein the probe provides light to the surface of the object ( ). Perimeter receiver fiber optics ( ) are spaced apart from a source fiber optic and receive light from the surface of the object ( ) being measured. Light from the perimeter fiber optics passes to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object being measured wherein the numerical apertures of the receiver fiber optics are different.


Find Patent Forward Citations

Loading…