The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2002

Filed:

May. 29, 1998
Applicant:
Inventors:

Daniel Wong, North York, CA;

Milivoje M. Aleksic, Richmond Hill, CA;

Assignee:

ATI Technologies, Inc., Ontario, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/500 ;
U.S. Cl.
CPC ...
G06F 1/500 ;
Abstract

The invention provides a method and apparatus for an anti-aliasing process that allows for super-sampling at a high subpixel resolution, but does not require the process and memory resources typically required for conventional super-sampling at this subpixel resolution. Each pixel is partitioned into an array that provides for a large number of subpixels, and a smaller set of super-samples from this set of subpixels are sampled and used to determine the resultant pixel values. Because the set of super-samples is substantially smaller in number (less than half) than the number of subpixels, the processing and memory requirements are substantially reduced. The set of super-samples are preferably determined so as to provide for a uniform sampling frequency in each of the major axes, and along each diagonal, even though the super-samples may not provide an uniform sampling of each pixel area.


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