The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6501286 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 31, 2002

Filed:

Aug. 27, 2001
Applicant:
Inventors:

Robert W. Balfanz, Caledonia, WI (US);

James E. Buhler, Waterford, WI (US);

W. Stephen Tait, Madison, WI (US);

Assignee:

S. C. Johnson & Son, Inc., Racine, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/742 ;
U.S. Cl.
CPC ...
G01N 2/742 ;
Abstract

An electrode array device for use with a conductive element to simulate a crevice that is subject to corrosive conditions. The device includes a non-conductive member and a plurality of electrodes. The non-conductive member has a face, with the member defining (i) an opening through the member, the opening passing through the face of the member, and (ii) a depression formed in the face and contiguous with at least a portion of the opening. The plurality of electrodes is embedded in the member, with each of the plurality of electrodes having a portion exposed from the member to the depression.


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Balfanz, Robert. (2002). Multiple reference electrode array for measuring open circuit potentials in artificial crevices (U.S. Patent No. 6501286). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6501286

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