The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2002
Filed:
Feb. 29, 2000
Masaaki Kurokawa, Hyogo, JP;
Mitsuyoshi Matsumoto, Hyogo, JP;
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Abstract
The present invention relates to an eddy current testing probe, which is suitable for used in a nondestructive test. The eddy current testing probe is provided with an excitation coil ( ) which generates an alternating magnetic field to generate an eddy current ( ) in a specimen ( ), and a pair of detection coils ( ) differentially connected and arranged in phase. A central portion (C ) of the pair of detection coils and a central portion (C ) of the excitation coil ( ) are arranged to be located at an identical or an almost identical position in a plan view taken in the direction toward the specimen ( ), and a flaw ( ) on the specimen ( ) is detected based on a difference between voltages generated in the pair of detection coils ( ) due to the eddy current ( ).